{"id":57,"date":"2022-07-20T07:36:41","date_gmt":"2022-07-19T22:36:41","guid":{"rendered":"http:\/\/150.60.227.26\/?page_id=57"},"modified":"2022-07-20T07:36:41","modified_gmt":"2022-07-19T22:36:41","slug":"analytical","status":"publish","type":"page","link":"https:\/\/www.maruyasu.co.jp\/en\/industrial\/analytical\/","title":{"rendered":"ANALYTICAL TECHNOLOGY"},"content":{"rendered":"
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Technologies to investigate or analyze metal materials, organic materials and
products, such as surface analysis, element\/physical property analysis,
spectroscopic\/separation analysis, and non-destructive internal observation.
By conducting material development, foreign substance investigation,
product non-destructive inspection, etc. in-house, we have realized shortening
development period and problem-solving period.<\/p>\n<\/div>\n

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FE-EPMA<\/h2>\n

Method to investigate the composition of the sample by irradiating the sample surface with an electron beam and analyzing the generated characteristic X-rays with a wavelength dispersive X-ray spectrometer (WDS).<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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SEM-EDS<\/h2>\n

Magnify and observe surface condition with the intensity of secondary electrons and reflected electrons generated by irradiating the sample surface with an electron beam.
Energy dispersive X-ray spectrometer (EDS) is also equipped. It acquires elemental information by detecting characteristic X-rays generated during electron beam irradiation.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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X-ray CT scanner<\/h2>\n

Observe the internal structure of an object by irradiating it with X-ray and detecting difference in amount of X-ray that is different by material or structure.
Three-dimensional information can also be acquired by computer processing data observed from 360-degree directions.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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Gas chromatograph
Mass spectrometer
(GC\/MS)<\/h2>\n

The sample components are vaporized in the pretreatment device and separated by GC into each component (compound).
Detecting the separated components with a mass spectrometer and make qualitative and quantitative analysis.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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FT-IR
Microscopic FT-IR<\/h2>\n

Making qualitative and quantitative analysis using the IR spectrum obtained by irradiating the sample with infrared light.
FT-IR microscopy enables analysis of micro-area that is too small to be seen.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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Contaminant measuring device<\/h2>\n

Detecting micron-order foreign matter collected from inside of products, and discriminates the size, quantity, and type (metal, carbon, fiber) by using high-speed image processing technology.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n

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Technologies to investigate or analyze metal materials, organic materials and products, such as surface analys […]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":43,"menu_order":4,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-57","page","type-page","status-publish","hentry"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t